Having trouble with preparing high quality samples from difficult interfaces or materials for imaging and characterization?
FEI has over 60 years of leadership in the design, manufacture and support of the widest range of microscopy techniques, and provides images and solutions down to the picometer scales. Its DualBeam (FIB/SEM) systems are the answer to 3D microscopy.
We are honored to have FEI’s Brandon Van Leer, Product Marketing Engineer of the SEM and DualBeam and Daniel Phifer, Product Marketing Engineer of the SEM, ESEM and DualBeam, as presenters of the webinar.
Tap on their technical expertise from this webinar; learn more about the advances in DualBeam technology and:
- How the latest detection and in situ technologies can be applied to a variety of sample preparation scenarios and types of materials
- How new techniques enable easy identification of the area of interest and improve final sample quality
- How DualBeam can be used to prepare the highest quality TEM samples for atomic scale imaging, while reducing processing times relative to other techniques
Brandon Van Leer has led the North American SEM, FIB and Small DualBeam applications team and is currently acting as the business development and product marketing engineer for FEI’s Materials Science business unit. Brandon has over 15 years of experience in various analytical techniques and over 9 years of experience in SEM and FIB applications. His current interest lies in nanoscale fabrication with FIB technology. Brandon received his M.S. in Electrical Engineering (2002) from Oregon State University and is a member of MSA, MRS and IEEE.
Daniel Phifer is one of the experts in providing technical support to ESEM, SEM and DualBeam users and has over 17 years of working history in FEI. Before FEI, Daniel worked with top material scientists, including Dr. David Joy, at the Oak Ridge National Lab, Tennessee, USA. Daniel has a M.S. from the University of Tennessee.
The webinar will be held on Wednesday, 29 April 2015, 14:30 (Indian Local Time).
Topic: Preparing the highest quality S/TEM samples with DualBeam technology
Speakers: Brandon Van Leer & Daniel Phifer
Date: 29 April 2015
Time: 14:30 (GMT +5.30)
Click here to register and mark the date and time on your calendar.